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  4. Standard "IEEE 1181-1991"
WITHDRAWN IEEE 1181-1991 13.12.1991 preview

IEEE 1181-1991

IEEE Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated- Circuit Process Characterization



STANDARD published on 13.12.1991


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207.00 USD

The information about the standard:

Designation standards: IEEE 1181-1991
Note: WITHDRAWN
Publication date standards: 13.12.1991
SKU: NS-415534
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEEE

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