Cookies
We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
IEEE 1445-2016
IEEE Standard for Digital Test Interchange Format (DTIF)
Translate name
STANDARD published on 27.1.2017
The information about the standard:
Designation standards: IEEE 1445-2016
Publication date standards: 27.1.2017
SKU: NS-674466
The number of pages: 64
Approximate weight : 192 g (0.42 lbs)
Country: International technical standard
Category: Technical standards IEEE
Annotation of standard text IEEE 1445-2016 :
Revision Standard - Active.
The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defines the following: user under test (UUT) model, stimulus and response, fault dictionary, and probe.
ISBN: 978-1-5044-3691-5, 978-1-5044-3692-2
Number of Pages: 64
Product Code: STD22392, STDPD22392
Keywords: automatic test equipment, ATE, DATPG, digital automated test program generator, digital test interchange format, DTIF, fault dictionary data, IEEE 1445(TM)
Category: Test Instrumentation and Techniques|General/Other - General Interests
We recommend:
Updating of laws
Do you want to be sure about the validity of used regulations?
We offer you a solution so that you could use valid and updated legislative regulations.
Would you like to get more information? Look at this page.
