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IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
STANDARD published on 1.8.2013
Designation standards: IEEE 1505.1-2008
Note: WITHDRAWN
Publication date standards: 1.8.2013
SKU: NS-415872
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEEE
Latest update: 2025-12-01 (Number of items: 2 249 634)
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