WITHDRAWN IEEE 1620-2004 29.4.2004 preview

IEEE 1620-2004

Standard for Test Methods for the Characterization of Organic Transistors and Materials



STANDARD published on 29.4.2004


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AvailabilityIN STOCK
Price141.00 USD excl. VAT
141.00 USD

The information about the standard:

Designation standards: IEEE 1620-2004
Note: WITHDRAWN
Publication date standards: 29.4.2004
SKU: NS-415999
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEEE



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