Cookies
We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
IEEE 1804-2017
IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules
Translate name
STANDARD published on 31.1.2018
The information about the standard:
Designation standards: IEEE 1804-2017
Publication date standards: 31.1.2018
SKU: NS-936175
The number of pages: 29
Approximate weight : 87 g (0.19 lbs)
Country: International technical standard
Category: Technical standards IEEE
Annotation of standard text IEEE 1804-2017 :
New IEEE Standard - Active.
The standard formalizes aspects of fault models as they are relevant to the generation of test patterns for digital circuits. Its scope includes (i) fault counting, (ii) fault classification, and (iii) fault coverage reporting across different ATPG (automatic test pattern generation) tools, for the single stuck-at fault model. With this standard, it shall be incumbent on all ATPG tools (which comply with this standard) to report fault coverage in a uniform way. This will facilitate the generation of a uniform coverage (and hence a uniform test quality) metric for large chips (including systems-on-chips – SOCs) with different cores and modules, for which test patterns have been independently generated.
ISBN: 978-1-5044-4317-3, 978-1-5044-4318-0
Number of Pages: 29
Product Code: STD22771, STDPD22771
Keywords: ATPG, DFT, fault models, fault simulation, IEEE 1804, semiconductor testing, stuck-at faults, test coverage.
Category: Test Technology
We recommend:
Updating of laws
Do you want to be sure about the validity of used regulations?
We offer you a solution so that you could use valid and updated legislative regulations.
Would you like to get more information? Look at this page.
