IEEE 2427-2025

Annotation of standard text IEEE 2427-2025 :

New IEEE Standard - Active.

A defect coverage accounting method based on simulation models for defects observed within integrated circuits (ICs) is defined in this standard. The portion of a defect universe, comprising thousands or millions of reasonably likely defects, that is detected or “covered” by tests of analog and mixed-signal circuits depends on many factors, which this standard considers, such as detectability, process variations, defect characteristics, and redundancy. The contents of a defect coverage summary are specified and dozens of commonly used terms are clearly defined to aid communication about the quality of tested ICs.

ISBN: 979-8-8557-2362-5, 979-8-8557-2776-0, 979-8-8557-2777-7

Number of Pages: 112

Product Code: STDAPE28057, STD28383, STDPD28383

Keywords: AMS test, analog/mixed-signal test, analog test coverage, defect coverage, defective parts per million, design for test, DFT, DPPM, IEEE 2427(TM)

Category: Test Instrumentation and Techniques|Test Technology

Draft Number: P2427/D0.42, June 2025 - APPROVED DRAFT