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USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors (For Ionizing Radiation)
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STANDARD published on 30.11.1968
Designation standards: IEEE 300-1969
Note: WITHDRAWN
Publication date standards: 30.11.1968
SKU: NS-936221
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEEE
Latest update: 2026-06-03 (Number of items: 2 281 391)
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