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  4. Standard "IEEE 300-1988"
WITHDRAWN IEEE 300-1988 29.12.1988 preview

IEEE 300-1988

IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors



STANDARD published on 29.12.1988


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Price188.00 USD excl. VAT
188.00 USD

The information about the standard:

Designation standards: IEEE 300-1988
Note: WITHDRAWN
Publication date standards: 29.12.1988
SKU: NS-416270
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEEE

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