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IEEE/ANSI N42.31-2003
American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation
Translate name
STANDARD published on 20.8.2003
The information about the standard:
Designation standards: IEEE/ANSI N42.31-2003
Publication date standards: 20.8.2003
SKU: NS-980851
The number of pages: 40
Approximate weight : 120 g (0.26 lbs)
Country: International technical standard
Category: Technical standards IEEE
Annotation of standard text IEEE/ANSI N42.31-2003 :
New IEEE Standard - Active.
Standard measurement and test procedures are established for wide-bandgap semiconductor detectors such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe), and mercuric iodide (HgI2) that can be used at room temperature for the detection and quantitative characterization of gamma-rays, X-rays, and charged particles. Standard terminology and descriptions of the principal features of the detectors are included. Included in this standard is an annex on interfering electromagnetic noise, which is a factor in such measurements.
ISBN: 978-0-7381-3798-8, 978-0-7381-3799-5
Number of Pages: 40
Product Code: STDPD95166, STD95166
Keywords: cadmium telluride, cadmium zinc telluride, CdTe, charged particle, CZT, electron-hole pair, gamma rays, HgI, ionizing radiation, ion pair, MCA, mercuric iodide, multichannel analyzer, semiconductor detector, X-ray
Category: Reactor Instruments and Controls
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