WITHDRAWN IEEE C62.35-2010 31.8.2010 preview

IEEE C62.35-2010

IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components



STANDARD published on 31.8.2010


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130.00 USD

The information about the standard:

Designation standards: IEEE C62.35-2010
Note: WITHDRAWN
Publication date standards: 31.8.2010
SKU: NS-417567
The number of pages: 26
Approximate weight : 78 g (0.17 lbs)
Country: International technical standard
Category: Technical standards IEEE

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