Cookies
We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
IEEE C62.42.3-2017
IEEE Guide for the Application of Surge Protective Components in Surge Protective Devices and Equipment Ports -- Part 3: Silicon PN-Junction
Translate name
STANDARD published on 13.3.2018
The information about the standard:
Designation standards: IEEE C62.42.3-2017
Publication date standards: 13.3.2018
SKU: NS-810222
The number of pages: 42
Approximate weight : 126 g (0.28 lbs)
Country: International technical standard
Category: Technical standards IEEE
Annotation of standard text IEEE C62.42.3-2017 :
New IEEE Standard - Active.
Surge protective components (SPCs) used in power and telecom surge protective devices (SPDs) and equipment ports are covered in the IEEE C62.42™ guide series. This part, Part 3 of the series, describes silicon PN-Junction clamping diode SPCs and covers technology variants, including forward biased semiconductor diodes, Zener breakdown semiconductor diodes, avalanche breakdown semiconductor diodes, punch-through semiconductor bipolar junction transistor diodes, and fold-back semiconductor bidirectional transistor diodes, as well as component construction; characteristics; ratings; and application examples.
ISBN: 978-1-5044-4056-1, 978-1-5044-4057-8
Number of Pages: 42
Product Code: STD22609, STDPD22609
Keywords: avalanche breakdown, clamping, diode, fold back, forward biased, IEEE C62.42.3™, PN-junction, punch-through, silicon, Zener breakdown
Category: Surge-Protective Devices
We recommend:
Technical standards updating
Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.
Would you like to know more? Look at this page.
