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IEEE/IEC 62525-2007
IEC/IEEE International Standard - Standard Test Interface Language (STIL) for Digital Test Vector Data
Translate name
STANDARD published on 9.12.2007
The information about the standard:
Designation standards: IEEE/IEC 62525-2007
Publication date standards: 9.12.2007
SKU: NS-675379
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEEE
Annotation of standard text IEEE/IEC 62525-2007 :
New IEEE Standard - Active.
Standard Test Interface Language (STIL) provides an interface between digital test generation
tools and test equipment. A test description language is defined that: (a) facilitates the transfer
of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and
timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports
the volume of test vector data generated from structured tests.
ISBN: 2-8318-9337-2
Number of Pages: 143
Product Code: STD95740
Keywords: automatic test pattern generator (ATPG), built-in self-test (BIST), computer-aided engineering
(CAE), cyclize, device under test (DUT), digital test vectors, event, functional vectors, pattern, scan vectors, signal, structural vectors, timed event, waveform, waveshape
Category: Test Technology
