Cookies
We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
IEEE/IEC 62526-2007
IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
Translate name
STANDARD published on 9.12.2007
The information about the standard:
Designation standards: IEEE/IEC 62526-2007
Publication date standards: 9.12.2007
SKU: NS-945120
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEEE
Annotation of standard text IEEE/IEC 62526-2007 :
New IEEE Standard - Active.
Standard Test Interface Language (STIL) provides an interface between digital test
generation tools and test equipment. Extensions to the test interface language (contained in this
standard) are defined that (1) facilitate the use of the language in the design environment and
(2) facilitate the use of the language for large designs encompassing subdesigns with reusable
patterns.
ISBN: 9-7807-3815-7221
Number of Pages: 128
Product Code: STD95741
Keywords: advanced scan architecture, core, environment, fail feedback, lockstep, parallel
patterns, parameterized data, pattern tiling, pragma, signal variable, system on chip (SoC), test
protocol
Category: Test Instrumentation and Techniques
We recommend:
Technical standards updating
Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.
Would you like to know more? Look at this page.
