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IEEE/IEC 62527-2007
IEC 62527 Ed. 1 (IEEE Std 1450.2(TM)-2002): Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification
STANDARD published on 9.12.2007
The information about the standard:
Designation standards: IEEE/IEC 62527-2007
Publication date standards: 9.12.2007
SKU: NS-415152
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEEE
Annotation of standard text IEEE/IEC 62527-2007 :
New IEEE Standard - Active.
This standard extends IEEE Std 1450-1999 (STIL) to support the definition of DC levels. STIL language constructs are defined to specify the DC conditions necessary to execute digital vectors on automated test equipment (ATE). STIL language extensions include structures for: (a) specifying the DC conditions for a device under test; (b) specifying DC conditions either globally, by pattern burst, by pattern, or by vector; (c) specifying alternate DC levels; and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.
ISBN: 9-7807-3815-7238
Number of Pages: 44
Product Code: STDSU95742
Keywords: : automated test equipment (ATE), comparator, DC levels, device power supply (DPS), device under test (DUT), driver, driver termination, dynamic load, functional test, parametric measurement unit (PMU), power sequence, slew rate, voltage clamp
Category: Test Instrumentation and Techniques
