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IEEE/IEC 62860-1-2013
IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
STANDARD published on 30.7.2013
The information about the standard:
Designation standards: IEEE/IEC 62860-1-2013
Publication date standards: 30.7.2013
SKU: NS-415167
The number of pages: 26
Approximate weight : 78 g (0.17 lbs)
Country: International technical standard
Category: Technical standards IEEE
Annotation of standard text IEEE/IEC 62860-1-2013 :
Adoption Standard - Active.
Recommended methods and standardized reporting practices for electrical
characterization of printed and organic ring oscillators are covered. Due to the nature of printed
and organic circuits, significant measurement errors can be introduced if the electrical
characterization design-of-experiment is not properly addressed. This standard describes the
most common sources of measurement error, particularly for high-impedance electrical
measurements commonly required for printed and organic ring oscillators. This standard also
gives recommended practices in order to minimize and/or characterize the effect of measurement
artifacts and other sources of error encountered while measuring printed and organic ring
oscillators.
ISBN: 978-0-7381-8687-0, 978-0-7381-8688-7
Number of Pages: 26
Product Code: STD98418, STDPD98418
Keywords: electrical characterization, high-impedance printing, organic transistor, printed electronics, ring oscillator
Category: Architecture/Parallel and High-Performance Computing
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