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IEEE/IEC 62860-2013
IEC/IEEE Test methods for the characterization of organic transistors and materials
STANDARD published on 30.7.2013
The information about the standard:
Designation standards: IEEE/IEC 62860-2013
Publication date standards: 30.7.2013
SKU: NS-415168
The number of pages: 28
Approximate weight : 84 g (0.19 lbs)
Country: International technical standard
Category: Technical standards IEEE
Annotation of standard text IEEE/IEC 62860-2013 :
Adoption Standard - Active.
Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.
ISBN: 978-0-7381-8685-6, 978-0-7381-8686-3
Number of Pages: 28
Product Code: STD98417, STDPD98417
Keywords: electrical characterization, FET, flexible electronics, high impedance, nanocomposite, nanotechnology, OFET, organic electronics, organic transistor, printed electronics, printing, transistor
Category: Architecture/Parallel and High-Performance Computing
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