Cookies
We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
ISO 13424:2013
Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
Automatically translated name:
Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
STANDARD published on 23.9.2013
The information about the standard:
Designation standards: ISO 13424:2013
Publication date standards: 23.9.2013
SKU: NS-424657
The number of pages: 46
Approximate weight : 138 g (0.30 lbs)
Country: International technical standard
Category: Technical standards ISO
The category - similar standards:
Annotation of standard text ISO 13424:2013 :
Description / Abstract: ISO 13424:2013 specifies the minimum amount of information required in reports of analyses of thin films on a substrate by XPS. These analyses involve measurement of the chemical composition and thickness of homogeneous thin films, and measurement of the chemical composition as a function of depth of inhomogeneous thin films by angle-resolved XPS, XPS sputter-depth profiling, peak-shape analysis, and variable photon energy XPS.
