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  4. Standard "ISO 14706:2014-ed.2.0"
Standard ISO 14706:2014-ed.2.0 25.7.2014 preview

ISO 14706:2014-ed.2.0

Surface chemical analysis — Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

Automatically translated name:

Surface chemical analysis -- Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy



STANDARD published on 25.7.2014


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Price206.30 USD excl. VAT
206.30 USD

The information about the standard:

Designation standards: ISO 14706:2014-ed.2.0
Publication date standards: 25.7.2014
SKU: NS-425696
The number of pages: 25
Approximate weight : 75 g (0.17 lbs)
Country: International technical standard
Category: Technical standards ISO

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Chemical analysis

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