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Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
Translate name
STANDARD published on 26.5.2025
Designation standards: ISO 17297:2025
Publication date standards: 26.5.2025
SKU: NS-1222521
The number of pages: 14
Approximate weight : 42 g (0.09 lbs)
Country: International technical standard
Category: Technical standards ISO
Chemical technology (Vocabularies)Physicochemical methods of analysis
Description / Abstract: This document defines the most commonly used terms for transmission electron microscopy (TEM) specimen preparation using focused ion beam (FIB).
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