Standard ISO 17470:2014-ed.2.0 6.1.2014 preview

ISO 17470:2014-ed.2.0

Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

Automatically translated name:

Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry



STANDARD published on 6.1.2014


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102.40 USD

The information about the standard:

Designation standards: ISO 17470:2014-ed.2.0
Publication date standards: 6.1.2014
SKU: NS-427680
The number of pages: 10
Approximate weight : 30 g (0.07 lbs)
Country: International technical standard
Category: Technical standards ISO

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