Standard ISO 17901-2:2015 29.6.2015 preview

ISO 17901-2:2015

Optics and photonics — Holography — Part 2: Methods for measurement of hologram recording characteristics

Automatically translated name:

Optics and photonics -- Holography -- Part 2: Methods for measurement of hologram recording characteristics



STANDARD published on 29.6.2015


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199.10 USD

The information about the standard:

Designation standards: ISO 17901-2:2015
Publication date standards: 29.6.2015
SKU: NS-611246
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: International technical standard
Category: Technical standards ISO

The category - similar standards:

Electronic components in general

Annotation of standard text ISO 17901-2:2015 :

Description / Abstract: ISO 17901-2:2015 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. ISO 17901-2:2015 does not intend to restrict manufacturing process.

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