We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
Translate name
STANDARD published on 28.2.2024
Designation standards: ISO 18118:2024-ed.3.0
Publication date standards: 28.2.2024
SKU: NS-1168357
The number of pages: 22
Approximate weight : 66 g (0.15 lbs)
Country: International technical standard
Category: Technical standards ISO
Description / Abstract: This document gives guidance on the measurement and use of experimentally-determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy. The methods described only apply to polycrystalline and amorphous materials, as effects inherent to single-crystal samples are not addressed.
Latest update: 2026-07-12 (Number of items: 2 286 472)
© Copyright 2026 NORMSERVIS s.r.o.