Standard ISO 19668:2017 14.8.2017 preview

ISO 19668:2017

Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials

Translate name

STANDARD published on 14.8.2017


Language
Format
AvailabilityIN STOCK
Price200.30 USD excl. VAT
200.30 USD

The information about the standard:

Designation standards: ISO 19668:2017
Publication date standards: 14.8.2017
SKU: NS-693606
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: International technical standard
Category: Technical standards ISO

The category - similar standards:

Chemical analysis

Annotation of standard text ISO 19668:2017 :

Description / Abstract: ISO 19668:2017 specifies a procedure by which elemental detection limits in X-ray photoelectron spectroscopy (XPS) can be estimated from data for a particular sample in common analytical situations and reported. This document is applicable to homogeneous materials and is not applicable if the depth distribution of elements is inhomogeneous within the information depth of the technique.



Cookies Cookies

We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.

You can refuse consent here.

Here you can customize your cookie settings according to your preferences.

We need your consent to use the individual data so that you can see information about your interests, among other things.