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ISO 22493:2014-ed.2.0
Microbeam analysis — Scanning electron microscopy — Vocabulary
Automatically translated name:
Microbeam analysis -- Scanning electron microscopy -- Vocabulary
STANDARD published on 9.4.2014
The information about the standard:
Designation standards: ISO 22493:2014-ed.2.0
Publication date standards: 9.4.2014
SKU: NS-429363
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: International technical standard
Category: Technical standards ISO
The category - similar standards:
Annotation of standard text ISO 22493:2014-ed.2.0 :
Description / Abstract: ISO 22493:2014 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate. ISO 22493:2014is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of ISO 22493:2014 are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.
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