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  4. Standard "ISO 23812:2009"
Standard ISO 23812:2009 8.4.2009 preview

ISO 23812:2009

Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth calibration for silicon using multiple delta-layer reference materials

Automatically translated name:

Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials



STANDARD published on 8.4.2009


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Price206.20 USD excl. VAT
206.20 USD

The information about the standard:

Designation standards: ISO 23812:2009
Publication date standards: 8.4.2009
SKU: NS-429743
The number of pages: 19
Approximate weight : 57 g (0.13 lbs)
Country: International technical standard
Category: Technical standards ISO

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