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Determination of modulation period of nano-multilayer coatings by low-angle X-ray methods
Translate name
STANDARD published on 22.7.2022
Designation standards: ISO 24688:2022
Publication date standards: 22.7.2022
SKU: NS-1069283
The number of pages: 8
Approximate weight : 24 g (0.05 lbs)
Country: International technical standard
Category: Technical standards ISO
Description / Abstract: This document specifies the substrate conditions and testing of the modulation period (including the principles for low-angle X-ray methods, the requirements of the coatings, the requirements for X-ray measuring apparatus, the calibration of apparatus and samples, and the testing conditions and calculation process) of nano-multilayer coatings by low-angle X-ray methods including X-ray reflectivity (XRR) and glancing incident X-ray diffraction (GIXRD).
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Latest update: 2026-06-10 (Number of items: 2 281 917)
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