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Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for GaN crystal surface defects — Part 2: Method for determining etch pit density
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STANDARD published on 30.4.2024
Designation standards: ISO 5618-2:2024
Publication date standards: 30.4.2024
SKU: NS-1182570
The number of pages: 25
Approximate weight : 75 g (0.17 lbs)
Country: International technical standard
Category: Technical standards ISO
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