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ISO 6342:2003-ed.2.0
Micrographics — Aperture cards — Method of measuring thickness of buildup area
Automatically translated name:
Micrographics -- Aperture cards -- Method of measuring thickness of buildup area
STANDARD published on 15.7.2003
The information about the standard:
Designation standards: ISO 6342:2003-ed.2.0
Publication date standards: 15.7.2003
SKU: NS-433754
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: International technical standard
Category: Technical standards ISO
The category - similar standards:
Annotation of standard text ISO 6342:2003-ed.2.0 :
Description / Abstract: ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.
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