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Surface chemical analysis — Depth profiling — Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer
Automatically translated name:
Surface chemical analysis -- Depth profiling -- Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer
STANDARD published on 2.7.2007
Designation standards: ISO/TR 22335:2007
Publication date standards: 2.7.2007
SKU: NS-420854
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: International technical standard
Category: Technical standards ISO
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