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Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
Translate name
STANDARD published on 1.4.2022
Designation standards: ISO/TS 22933:2022
Publication date standards: 1.4.2022
SKU: NS-1052691
The number of pages: 15
Approximate weight : 45 g (0.10 lbs)
Country: International technical standard
Category: Technical standards ISO
Description / Abstract: This document specifies a method for measuring the mass resolution in SIMS, and how to compare the mass resolution between different instruments (e.g. TOF-SIMS, Magnetic SIMS, Quadrupole SIMS, Fourier Transform SIMS, etc.) by considering the peak shapes.
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