We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Test method of long-term reliability of gate insulator for SiC devices at high temperature
Translate name
STANDARD published on 23.3.2010
| Language | |
| Format |
|
| Availability | IN STOCK |
| Price | ONREQUEST excl. VAT |
| ON REQUEST |
Designation standards: JIS C2162:2010
Publication date standards: 23.3.2010
SKU: NS-1075015
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: Japanese technical standard
Category: Technical standards JIS
Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.
Would you like to know more? Look at this page.
Latest update: 2026-05-14 (Number of items: 2 277 490)
© Copyright 2026 NORMSERVIS s.r.o.