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Testing method of resistivity for silicon crystals and silicon wafers with four-point probe
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STANDARD published on 30.11.1995
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Designation standards: JIS H0602:1995
Publication date standards: 30.11.1995
SKU: NS-1078235
The number of pages: 14
Approximate weight : 42 g (0.09 lbs)
Country: Japanese technical standard
Category: Technical standards JIS
Semiconducting materialsOther non-ferrous metals and their alloys
Latest update: 2026-05-04 (Number of items: 2 275 493)
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