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Standard JIS H0609:1999 29.2.2000 preview

JIS H0609:1999

Test methods of crystalline defects in silicon by preferential etch techniques

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STANDARD published on 29.2.2000


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The information about the standard:

Designation standards: JIS H0609:1999
Publication date standards: 29.2.2000
SKU: NS-1078239
The number of pages: 17
Approximate weight : 51 g (0.11 lbs)
Country: Japanese technical standard
Category: Technical standards JIS

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Integrated circuits. MicroelectronicsOther non-ferrous metals and their alloys

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