JIS H0611:1994

Methods of measurement of thickness, thickness variation and bow for silicon wafer

Translate name

STANDARD published on 28.2.1994

Language
Format	electronic design (pdf) - ON REQUEST Print design - ON REQUEST
Availability	IN STOCK
Price	ONREQUEST excl. VAT
ON REQUEST

The information about the standard:

Designation standards: JIS H0611:1994
Publication date standards: 28.2.1994
SKU: NS-1078241
The number of pages: 6
Approximate weight : 18 g (0.04 lbs)
Country: Japanese technical standard
Category: Technical standards JIS

Print

Send to a colleague

Query

The category - similar standards:

Semiconducting materials Other non-ferrous metals and their alloys

We recommend:

Technical standards updating

Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.

Would you like to know more? Look at this page.

Cookies

We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.

You can refuse consent here.

Here you can customize your cookie settings according to your preferences.

We need your consent to use the individual data so that you can see information about your interests, among other things.