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  4. Standard "JIS H0613:1978"
Standard JIS H0613:1978 5.1.1978 preview

JIS H0613:1978

Visual inspection for sliced and lapped silicon wafers

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STANDARD published on 5.1.1978


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The information about the standard:

Designation standards: JIS H0613:1978
Publication date standards: 5.1.1978
SKU: NS-1078242
The number of pages: 4
Approximate weight : 12 g (0.03 lbs)
Country: Japanese technical standard
Category: Technical standards JIS

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Semiconducting materialsOther non-ferrous metals and their alloys

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