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  4. Standard "JIS H0614:1996"
Standard JIS H0614:1996 31.1.1996 preview

JIS H0614:1996

Visual inspection for silicon wafers with specular surfaces

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STANDARD published on 31.1.1996


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The information about the standard:

Designation standards: JIS H0614:1996
Publication date standards: 31.1.1996
SKU: NS-1078243
The number of pages: 8
Approximate weight : 24 g (0.05 lbs)
Country: Japanese technical standard
Category: Technical standards JIS

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Semiconducting materialsOther non-ferrous metals and their alloys

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