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Standard JIS H0616:2024 21.3.2024 preview

JIS H0616:2024

Test method for low substitutional atomic carbon content of single crystal silicon by Fourier transform infrared absorption spectroscopy at room temperature

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STANDARD published on 21.3.2024


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The information about the standard:

Designation standards: JIS H0616:2024
Publication date standards: 21.3.2024
SKU: NS-1183407
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: Japanese technical standard
Category: Technical standards JIS

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Semiconducting materialsNon-metalliferous mineralsOther non-ferrous metals and their alloys

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