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Standard JIS H0617:2024 21.3.2024 preview

JIS H0617:2024

Test method for determination of low carbon impurity concentration in silicon single crystals by photoluminescence spectroscopy

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STANDARD published on 21.3.2024


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The information about the standard:

Designation standards: JIS H0617:2024
Publication date standards: 21.3.2024
SKU: NS-1183408
The number of pages: 22
Approximate weight : 66 g (0.15 lbs)
Country: Japanese technical standard
Category: Technical standards JIS

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The category - similar standards:

Semiconducting materialsNon-metalliferous mineralsOther non-ferrous metals and their alloys

Latest update: 2026-08-19 (Number of items: 2 298 207)
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