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Standard JIS K0148:2026 20.1.2026 preview

JIS K0148:2026

Surface chemical analysis-Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

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STANDARD published on 20.1.2026


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The information about the standard:

Designation standards: JIS K0148:2026
Publication date standards: 20.1.2026
SKU: NS-1261785
The number of pages: 28
Approximate weight : 84 g (0.19 lbs)
Country: Japanese technical standard
Category: Technical standards JIS

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Chemical analysis

Latest update: 2026-03-03 (Number of items: 2 264 974)
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