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Standard JIS K0160:2009 20.7.2009 preview

JIS K0160:2009

Surface chemical analysis -- Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy

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STANDARD published on 20.7.2009


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The information about the standard:

Designation standards: JIS K0160:2009
Publication date standards: 20.7.2009
SKU: NS-1078726
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: Japanese technical standard
Category: Technical standards JIS

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