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Standard JIS K0160:2026 20.1.2026 preview

JIS K0160:2026

Surface chemical analysis-Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy

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STANDARD published on 20.1.2026


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The information about the standard:

Designation standards: JIS K0160:2026
Publication date standards: 20.1.2026
SKU: NS-1261786
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: Japanese technical standard
Category: Technical standards JIS

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Chemical analysis

Latest update: 2026-07-17 (Number of items: 2 288 561)
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