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Standard JIS K0190:2010 20.4.2010 preview

JIS K0190:2010

Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

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STANDARD published on 20.4.2010


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The information about the standard:

Designation standards: JIS K0190:2010
Publication date standards: 20.4.2010
SKU: NS-1078747
The number of pages: 12
Approximate weight : 36 g (0.08 lbs)
Country: Japanese technical standard
Category: Technical standards JIS

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