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Test method for thickness of fine ceramic thin films -- Film thickness by contact probe profilometer
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STANDARD published on 31.1.1998
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Designation standards: JIS R1636:1998
Publication date standards: 31.1.1998
SKU: NS-1081250
The number of pages: 6
Approximate weight : 18 g (0.04 lbs)
Country: Japanese technical standard
Category: Technical standards JIS
Latest update: 2026-01-18 (Number of items: 2 257 146)
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