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Standard ÖVE EN IEC 60749-34-1 1.8.2026 preview

ÖVE EN IEC 60749-34-1

Semiconductor devices - Mechanical and climatic test methods -- Part 34-1: Power cycling test for power semiconductor module (( IEC 60749-34-1:2025) EN IEC 60749-34-1:2025) (german version)

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STANDARD published on 1.8.2026


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The information about the standard:

Designation standards: ÖVE EN IEC 60749-34-1
Publication date standards: 1.8.2026
SKU: NS-1279314
The number of pages: 30
Approximate weight : 90 g (0.20 lbs)
Country: Austrian technische Norm
Category: Technical standards ÖNORM

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Semiconductor devices in general

Annotation of standard text ÖVE EN IEC 60749-34-1 :

Dieser Teil von IEC 60749 beschreibt ein Prüfverfahren, das zur Ermittlung der Widerstandsfähigkeit eines Leistungshalbleitermoduls gegen aus Lastwechselzyklen resultierende thermische und mechanische Beanspruchungen der im Gehäuse montierten Halbleiter wie auch der innen liegenden Verbinder verwendet wird. Er basiert auf IEC 60749-34, wurde jedoch speziell für Leistungshalbleitermodulprodukte entwickelt, darunter Bipolartransistoren mit isoliertem Gate (IGBT), Metalloxid-Halbleiter-Feldeffekttransistoren (MOSFET), Dioden und Thyristoren.

Latest update: 2026-08-26 (Number of items: 2 298 418)
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