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Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods ((IEC 62276:2025) EN IEC 62276:2025) (german version)
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STANDARD published on 1.8.2026
Designation standards: ÖVE EN IEC 62276
Publication date standards: 1.8.2026
SKU: NS-1279333
The number of pages: 46
Approximate weight : 138 g (0.30 lbs)
Country: Austrian technische Norm
Category: Technical standards ÖNORM
Diese Dokument gilt für die Herstellung von Einkristall-Wafern aus synthetischen Quarzkristallen, Lithiumniobat(LN)-, Lithiumtantalat(LT)-, Lithiumtetraborat(LBO)-Kristallen und Lanthanum-Gallium-Silikat (LGS), die für die Verwendung als Substrate bei der Herstellung von Oberflächenwellen-(OFW-)Filtern und Resonatoren vorgesehen sind.
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Latest update: 2026-08-26 (Number of items: 2 298 418)
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