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Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005)
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STANDARD published on 1.11.2016
Designation standards: ÖNORM EN ISO 18452
Publication date standards: 1.11.2016
SKU: NS-776450
The number of pages: 15
Approximate weight : 45 g (0.10 lbs)
Country: Austrian technische Norm
Category: Technical standards ÖNORM
Diese Internationale Norm legt ein Verfahren zur Bestimmung der Schichtdicke feinkeramischer Schichten und keramischer Schichten mit einem Kontaktprofilometer fest. Das Verfahren ist für Schichtdicken im Bereich von 10 nm bis 10 000 nm geeignet.
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