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SAE AS6171/11
Techniques for Suspect/Counterfeit EEE Parts Detection by Design Recovery Test Methods
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STANDARD published on 1.10.2016
The information about the standard:
Designation standards: SAE AS6171/11
Publication date standards: 1.10.2016
SKU: NS-666948
Country: American technical standard
Category: Technical standards SAE
Annotation of standard text SAE AS6171/11 :
This method outlines the requirements, capabilities, and limitations associated with the application of Design Recovery for the detection of counterfeit electronic parts including: Operator training; Sample preparation; Imaging techniques; Data interpretation; Design/functional matching; Equipment maintenance and; Reporting of data. The method is primarily aimed at analyses performed by circuit delayering and imaging with a scanning electron microscope or optical microscope; however, many of the concepts are applicable to other microscope and probing techniques to recover design data. The method is not intended for the purpose of manufacturing copies of a device, but rather to compare images or recover the design for determination of authenticity.
If AS6171/11 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
SUBJECT TAXONOMY: Electronic equipment, Microscopy, Risk management, Supplier assessment, Counterfeit parts, Test procedures
SUBFILE: Aerospace
TYPE OF DOCUMENT: Aerospace Standard
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