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Techniques for Suspect/Counterfeit EEE Parts Detection by X-Ray Fluorescence Test Methods
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STANDARD published on 1.6.2022
Designation standards: SAE AS6171/3
Publication date standards: 1.6.2022
SKU: NS-1066944
Country: American technical standard
Category: Technical standards SAE
XRF technique for counterfeit detection is applicable to electrical, electronic and electromechanical (EEE) parts as listed in AS6171 General Requirements. In general, the detection technique is meant for use on piece parts prior to assembly on a circuit board or on the parts that are removed from a circuit board. The applicability spans a large swath of active, passive and electromechanical parts.
If AS6171/3 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
SUBJECT TAXONOMY: Electronic equipment, Risk management, Supplier assessment, Counterfeit parts, Test procedures, X-ray inspections
SUBFILE: Aerospace
TYPE OF DOCUMENT: Aerospace Standard
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Latest update: 2026-05-17 (Number of items: 2 278 942)
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