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Standard for Mitigating the Effects of Tin Whiskers in Aerospace, Defense, and High Performance Electronic Systems
Translate name
STANDARD published on 1.12.2025
Designation standards: SAE GEIASTD0005_2B
Publication date standards: 1.12.2025
SKU: NS-1262342
Country: American technical standard
Category: Technical standards SAE
This standard establishes processes for performing and documenting mitigation steps taken to reduce the harmful effects of tin whiskers in electronic systems for ADHP applications. This includes electronic piece parts and mechanical hardware that are used on or in the proximity of electronics.
This document identifies the requirements for mitigating the effects of tin whiskers applicable to the requirements of the SAE GEIA-STD-0005-1 Lead-free Control Plan (LFCP). An LFCP documents the specific Pb-free materials and assembly processes the LFCP owner will use to eliminate or mitigate the Pb-free risks to assure customers that their ADHP soldered electronic products will meet the applicable reliability requirements of the customer. This standard may also be used independently of SAE GEIA-STD-0005-1.
SUBFILE: Aerospace
TYPE OF DOCUMENT: Aerospace Standard
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Latest update: 2026-05-17 (Number of items: 2 278 942)
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