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Environmental Tests and Associated Failure Mechanisms
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STANDARD published on 1.9.2014
Designation standards: SAE SSB1_002
Publication date standards: 1.9.2014
SKU: NS-664793
Country: American technical standard
Category: Technical standards SAE
This document is an annex to EIA Engineering Bulletin SSB-1, Guidelines for Using Plastic Encapsulated Microcircuits and Semiconductors in Military, Aerospace and Other Rugged Applications.
This document provides reference information concerning the environmental stresses associated with tests specifically designed to apply to (or have unique implications for) plastic encapsulated microcircuits and semiconductors, and the specific failures induced by these environmental stresses.
SUBJECT TAXONOMY: Electrical systems, Plastics, Semiconductors
SUBFILE: Aerospace
TYPE OF DOCUMENT: Aerospace Standard
Stabilized: Sep 2014 
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